Semiconductor device high and low temperature testing equipment

Applied to reliability tests such as characteristic analysis of components, high and low temperature temperature variation testing, temperature shock testing, failure analysis, etc

This type of device solves the local testing requirements that traditional high and low temperature boxes cannot meet. The device is easy to move and suitable for high and low temperature testing of a single component of a variety of devices or components with flat surfaces and flat structures

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Free door-to-door delivery nationwide: The delivery time varies from 5-7 days in various provinces of northwest, northeast, and southwest. Due to uncertain factors, the delivery time in some places is more than 7 days, while in other provinces it is 3-5 days. The delivery time in Jiangsu, Zhejiang, and Shanghai is 1-2 days

We do not make any promises regarding transportation time. In the event of holidays, rain, snow, heavy fog, etc., there may be occasional delays in logistics transportation, which is beyond the manufacturer's control. Please understand.

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2880680455

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182 2161 6900