半导体冷却一体机

Semiconductor industry temperature control expert

Home Products News About us Contact us

CN

Semiconductor Chiller

gas refrigerator Liquid cooled refrigeration unit Direct cooling refrigeration machine Semiconductor device testing Semiconductor thermoelectric cooler LCD panel specific temperature control

New energy component testing

New energy motor testing IGBT high and low temperature testing Component measurement and control system Battery pack application testing High temperature testing of automotive chips Converter/inverter performance testing bench

Biopharmaceutical and chemical engineering

High precision high and low temperature integrated machine Supporting ultra-high temperature reaction kettle Microchannel tube type dedicated temperature control system Explosion proof unit High temperature enclosed circulator Liquid cooler

Low temperature freezer

Low temperature chiller Low temperature air conditioner Direct cooling refrigeration machine Ultra low temperature freezer Low temperature storage of biological samples Non standard customization

Non standard customization

Secondary heat exchange TCU solution Primary energy applications Direct TCU solution Integrated explosion-proof customized temperature control system TCU temperature control unit

Products

Semiconductor Chiller New energy component testing Biopharmaceutical and chemical engineering Low temperature freezer Non standard customization

Semiconductor wafer temperature control

Temperature control of double-layer reactors in the fields of chemical, pharmaceutical, and biological industries
Temperature control of distillation crystallization purification system
Temperature control of high-pressure reactor
Dynamic constant temperature control of cold and heat sources in a double-layer reactor
Temperature control of mixing tank
Thermostatic control of cold and heat sources in microchannel reactors
Temperature control of crystallization system

Probe station high and low temperature control system

The probe station is the core component of a high-precision, high and low temperature probe station. Its main function is to connect the chip to the testing instrument, and measure the electrical performance of the chip and the operating status of specific functions through the interaction between the probe and the chip.

Semiconductor device high and low temperature testing equipment

Applied to reliability tests such as characteristic analysis of components, high and low temperature temperature variation testing, temperature shock testing, failure analysis, etc

Wafer level probe stage temperature control equipment

Temperature control of double-layer reactors in the fields of chemical, pharmaceutical, and biological industries
Temperature control of distillation crystallization purification system
Temperature control of high-pressure reactor
Dynamic constant temperature control of cold and heat sources in a double-layer reactor
Temperature control of mixing tank
Thermostatic control of cold and heat sources in microchannel reactors
Temperature control of crystallization system

Wafer high and low temperature testing equipment

A conductive heating and cooling system used for chip testing at temperature. Its main use is for wafer testing in the probe station.

Gas cooled wafer testing

Temperature control of double-layer reactors in the fields of chemical, pharmaceutical, and biological industries
Temperature control of distillation crystallization purification system
Temperature control of high-pressure reactor
Dynamic constant temperature control of cold and heat sources in a double-layer reactor
Temperature control of mixing tank
Thermostatic control of cold and heat sources in microchannel reactors
Temperature control of crystallization system

QQ

2880680455

Telephone

182 2161 6900